A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit

A 65nm Complementary Metal–Oxide–Semiconductor 400ns Measurement Delay Negative-Bias-Temperature-Instability Recovery Sensor with Minimum Assist Circuit

Impact of RTN and NBTI on Synchronous Circuit Reliability

We investigate a synchronous circuit reliability for 65nm−40nm CMOS technology. The impact of Random telegraph noise (RTN) and Negative Bias Temperature Instability (NBTI) on a circuit is evaluated. We found two things. (i) RTN at one or a few stages of a combinational circuit induces a large delay fluctuation under low voltage operation. (ii) LSI lifetime can be extended by utilizing NBTI reco...

Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing

1. Introduction Designing reliable systems has become more difficult in recent years. Besides conventional problems such as transistor leakage, the degradation and variation of transistor performance have a severe impact on the dependability of VLSI systems[1]-[3]. Negative-Bias-Temperature-Instability (NBTI) is one of the strongest reliability concerns for CMOS circuits[4][5]. Remarkable pheno...

Adaptive Error-Prediction Aging Sensor for On-Line Monitoring of Performance Errors

This paper presents a new aging sensor architecture for error prediction of performance errors in synchronous digital circuits. The aging sensor is based on a new flip-flop with built-in logic that predicts the errors by monitoring long-term performance degradation of CMOS digital systems. The main advantage is that the sensor’s long-term degradation effects increase its sensitivity to performa...

Simulation-Based Analysis For NBTI Degradation In Combinational CMOS VLSI Circuits

The negative-bias temperature instability (NBTI) is one of the dominant aging degradation mechanism in today Very Large Scale Integration (VLSI) Integrated Circuits (IC). With the further decreasing of the transistor dimensions and reduction of supply voltage, the NBTI degradation may become a critical reliability threat. Nevertheless, most of the EDA tools lack in the ability to predict and an...